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Updated: May 2, 2026

In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions
Published on: June 16, 2014
Review of highly charged heavy ion production with electron cyclotron resonance ion source (invited)
1Nishina Center for Accelerator-Based Science, RIKEN, Hirosawa 2-1, Wako, Saitama 351-0198, Japan.
Abstract:
The electron cyclotron resonance ion source (ECRIS) plays an important role in the advancement of heavy ion accelerators and other ion beam applications worldwide, thanks to its remarkable ability to produce a great variety of intense highly charged heavy ion beams. Great efforts over the past decade have led to significant ECRIS performance improvements in both the beam intensity and quality. A number of high-performance ECRISs have been built and are in daily operation or are under construction to meet the continuously increasing demand. In addition, comprehension of the detailed and complex physical processes in high-charge-state ECR plasmas has been enhanced experimentally and theoretically. This review covers and discusses the key components, leading-edge developments, and enhanced ECRIS performance in the production of highly charged heavy ion beams.
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