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Gas feeding molecular phosphorous ion source for semiconductor implanters
V I Gushenets1, E M Oks1, A S Bugaev1
1High Current Electronics Institute, Siberian Branch of Russian Academy of Sciences, Tomsk 634055, Russia.
The Review of Scientific Instruments
|March 6, 2014
Summary
This study explores using phosphine gas to create phosphorus ion beams for semiconductor doping. Researchers investigated how phosphine decomposition and discharge parameters affect ion beam composition.
Area of Science:
- Materials Science
- Chemical Engineering
- Semiconductor Physics
Background:
- Phosphorus is a key dopant in semiconductor manufacturing.
- Red phosphorus is a common, stable source for phosphorus vapor (P4).
- Existing methods utilize red phosphorus for polyatomic molecular ion beams.
Purpose of the Study:
- To investigate phosphine as an alternative phosphorus vapor source.
- To generate polyatomic phosphorus ion beams using phosphine.
- To analyze the impact of process parameters on ion beam characteristics.
Main Methods:
- Utilizing phosphine (PH3) as a precursor gas.
- Employing a specialized dissociator to decompose phosphine at ~700°C.
- Heating phosphine to produce molecular hydrogen and phosphorus (P4).
- Directing reaction products to a discharge chamber for ion beam generation.
Main Results:
- Demonstrated successful generation of phosphorus ion beams from phosphine.
- Presented experimental data on the influence of discharge parameters.
- Showcased the effect of dissociator heater temperature on ion beam mass-charge state.
Conclusions:
- Phosphine is a viable alternative source for generating phosphorus ion beams.
- Process parameters significantly influence the resulting ion beam composition.
- This method offers a novel approach for semiconductor doping applications.
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