A new thermographic NDT for condition monitoring of electrical components using ANN with confidence level analysis

A S N Huda1, S Taib1, K H Ghazali2

  • 1School of Electrical and Electronic Engineering, Universiti Sains Malaysia, 14300, Nibong Tebal, Pulau Pinang, Malaysia.

ISA Transactions
|March 6, 2014
PubMed

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