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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
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Dependency of the tunneling decay coefficient in molecular tunneling junctions on the topography of the bottom

Li Yuan1, Li Jiang, Bo Zhang

  • 1Department of Chemistry, National University of Singapore, 3 Science Drive 3, Singapore, 117543 (Singapore) http://staff.science.nus.edu.sg/∼christiannijhuis/index.html; Graphene Research Centre, National University of Singapore, 6 Science Drive 2, Singapore, 117546 (Singapore).

Angewandte Chemie (International Ed. in English)
|March 12, 2014
PubMed

Keywords:
bottom electrodescharge transportmolecular electronicsself-assembled monolayerstunneling decay constant

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