Resistance mapping in mesoscopic films of low dimensional materials

We present a low-cost, scalable technique for mapping local electrical properties across large areas with micrometer-scale lateral resolution. The method utilizes a flexible polymer cantilever coated by microfabricated graphite electrodes to probe local surface resistance. Samples can be scanned on a motorized translation stage, enabling automated, spatially resolved electrical measurements over centimeter-scale regions. The use of graphite electrodes ensures low friction and wear for both the sample and the electrodes, allowing repeated measurements on thin films without sample damage, unlike conventional metal probes. We demonstrate robust, pixel-by-pixel resistance maps on various samples, including patterned graphite thin films and ITO on glass structures. Its simplicity, adaptability, and user-friendly operation make this platform well-suited for rapid electrical testing and high-throughput quality control in advanced electronics research.