Phase Contrast and Differential Interference Contrast Microscopy
Mass Analyzers: Overview
Mass Analyzers: Common Types
X-ray Crystallography
Determination of Crystal Structures
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Updated: May 2, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on: May 10, 2021
Keivan Majidi1, Jun Li, Carol Muehleman
1Department of Electrical and Computer Engineering, Illinois Institute of Technology, Chicago, IL 60616, USA.
Analyzer-based phase-contrast x-ray imaging (ABI) noise is directly related to source intensity. Optimal parametric images require only a few analyzer-crystal angular measurements, minimizing noise and radiation dose.
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