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Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities
Published on: July 24, 2015
Theoretical analysis of a dual-probe scanning tunneling microscope setup on graphene
Mikkel Settnes1, Stephen R Power1, Dirch H Petersen1
1Center for Nanostructured Graphene (CNG), Department of Micro- and Nanotechnology Engineering, Technical University of Denmark, DK-2800 Kongens Lyngby, Denmark.
Abstract:
Experimental advances allow for the inclusion of multiple probes to measure the transport properties of a sample surface. We develop a theory of dual-probe scanning tunneling microscopy using a Green's function formalism, and apply it to graphene. Sampling the local conduction properties at finite length scales yields real space conductance maps which show anisotropy for pristine graphene systems and quantum interference effects in the presence of isolated impurities. Spectral signatures in the Fourier transforms of real space conductance maps include characteristics that can be related to different scattering processes. We compute the conductance maps of graphene systems with different edge geometries or height fluctuations to determine the effects of nonideal graphene samples on dual-probe measurements.
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