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Updated: May 1, 2026

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
Published on: July 5, 2016
This study introduces a novel multi-wavelength scanning method for digital holographic microscopy phase unwrapping. The technique accurately reconstructs phase images, overcoming noise and discontinuities for improved microscopy analysis.
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Published on: February 23, 2018
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