Related Experiment Video
Updated: May 1, 2026

11:33
All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
8.3K
Pulse characterization by THG d-scan in absorbing nonlinear media.
Optics Express
|March 26, 2014
Summary
Few-cycle pulse characterization is achieved using third harmonic generation dispersion scan (THG d-scan) with TiO(2)-SiO(2) thin films. This method accurately measures ultrashort laser pulses, unaffected by material absorption edges.
Area of Science:
- Optics and Photonics
- Materials Science
- Ultrafast Lasers
Background:
- Accurate characterization of ultrashort laser pulses is crucial for scientific research.
- Third Harmonic Generation (THG) is a nonlinear optical process sensitive to pulse properties.
- Developing robust THG-based methods is essential for reliable pulse measurements.
Purpose of the Study:
- To demonstrate few-cycle pulse characterization using THG dispersion scan (THG d-scan).
- To investigate the use of TiO(2)-SiO(2) thin films with varying compositions as nonlinear media for THG d-scan.
- To assess the impact of material band gap and absorption edges on pulse retrieval accuracy.
Main Methods:
- Performing THG d-scan measurements using thin films of TiO(2)-SiO(2) with controlled compositions.
- Varying the TiO(2) concentration to tune the band gap and absorption edge of the nonlinear media.
- Employing a robust retrieval algorithm that accounts for wavelength-dependent nonlinearity via a spectral weight function.
Main Results:
- Achieved agreement in retrieved pulse durations within 5% across different nonlinear media.
- Demonstrated that reconstructed pulse shapes are immune to the material's absorption edges.
- Validated the effectiveness of the spectral weight function in the retrieval algorithm.
Conclusions:
- TiO(2)-SiO(2) thin films are suitable nonlinear media for THG d-scan pulse characterization.
- The THG d-scan method, coupled with a robust algorithm, provides accurate ultrashort pulse measurements.
- The technique's resilience to absorption edges broadens its applicability in ultrafast optics.

