Development of an X-ray pixel detector with multi-port charge-coupled device for X-ray free-electron laser...

Area of Science:

• Instrumentation
• Particle Physics
• Materials Science

Background:

• X-ray Free-Electron Laser (XFEL) experiments require advanced detectors capable of handling high photon fluxes and radiation.
• Existing detectors may not meet the stringent requirements for radiation hardness and high-speed readout.

Purpose of the Study:

• To develop and characterize a novel X-ray pixel detector utilizing a multi-port charge-coupled device (MPCCD).
• To ensure the detector's suitability for demanding XFEL environments through radiation hardness and optimized performance.

Main Methods:

• Selected fabrication processes for the charge-coupled device (CCD) based on X-ray radiation hardness.
• Optimized sensor design to maximize full well capacity (5 Me-) within 50 μm square pixels.
• Ensured single photon detection capability for X-ray photons > 6 keV and a readout speed of 60 frames/s.

Main Results:

• Developed an X-ray pixel detector with a multi-port charge-coupled device (MPCCD).
• Achieved high radiation hardness against an estimated annual dose of 1.6 × 10^14 photon/mm^2.
• Optimized sensor parameters including full well capacity, pixel size, photon energy detection, and readout speed.

Conclusions:

• The developed MPCCD detector system is suitable for X-ray Free-Electron laser experiments.
• The detector demonstrates robust performance, radiation hardness, and high-speed readout capabilities.
• Further details on performance, calibration, and operation are presented in the paper.