X-ray Imaging
Atomic Spectroscopy: Effects of Temperature
Atomic Emission Spectroscopy: Instrumentation
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Updated: May 1, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
K Nishimura1, A Sanpei1, H Tanaka1
1Department of Electronics, Kyoto Institute of Technology, Kyoto 606-8585, Japan.
A new two-dimensional (2D) electron temperature diagnostic system was developed for studying thermal structures in reversed field pinch (RFP) devices. This system successfully differentiates thermal patterns in quasi-single helicity from multi-helicity RFP states.
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