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Atomic Force Microscopy01:08

Atomic Force Microscopy

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Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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Related Experiment Video

Updated: May 1, 2026

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
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Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

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High-speed spiral imaging technique for an atomic force microscope using a linear quadratic Gaussian controller.

H Habibullah1, H R Pota1, I R Petersen1

  • 1School of Engineering and Information Technology, University of New South Wales, Canberra, Australian Capital Territory 2612, Australia.

The Review of Scientific Instruments
|April 3, 2014
PubMed
Summary
This summary is machine-generated.

This study introduces a novel spiral imaging technique for atomic force microscopy (AFM), enabling faster scanning than traditional raster methods. The new approach uses controlled sinusoidal signals for high-speed, continuous atomic force microscope scanning.

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Area of Science:

  • Atomic Force Microscopy
  • Scanning Probe Microscopy
  • Nanotechnology

Background:

  • Traditional atomic force microscopy (AFM) relies on raster scanning, which limits imaging speed.
  • Piezoelectric tube scanners (PTS) in AFMs have resonant modes that can affect scanning performance.
  • Improving scanning speed and accuracy is crucial for advanced AFM applications.

Purpose of the Study:

  • To develop and demonstrate a high-speed spiral imaging technique for AFM as an alternative to raster scanning.
  • To enhance the tracking performance and reduce phase errors in AFM scanners.
  • To improve the overall scanning rate and efficiency of AFM imaging.

Main Methods:

  • Implemented a spiral scanning approach using single-frequency cosine and sine waves with varying amplitudes for AFM's piezoelectric tube scanner (PTS).
  • Designed a linear quadratic Gaussian (LQG) controller with an internal model and vibration compensator to track sinusoidal signals and damp PTS resonance.
  • Utilized fifth-order Butterworth and Gaussian filters for post-processing of position sensor signals and images, respectively.

Main Results:

  • Achieved faster scanning rates compared to conventional raster scanning methods.
  • Reduced phase error between input and output sinusoids from the X and Y-PTSs, improving scanner tracking.
  • Demonstrated improved image quality and continuous high-speed scanning capabilities.

Conclusions:

  • The proposed high-speed spiral imaging technique offers a significant advancement over traditional raster scanning in atomic force microscopy.
  • The developed control scheme effectively manages scanner dynamics, enabling faster and more accurate nanoscale imaging.
  • This method paves the way for more efficient and rapid data acquisition in AFM applications.