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Note: A simple charge neutralization method for measuring the secondary electron yield of insulators
Ming Weng1, Meng Cao1, Hong-Juan Zhao1
1Key Laboratory for Physical Electronics and Devices of the Ministry of Education, Department of Electronic Science and Technology, Xi'an Jiaotong University, Xi'an 710049, People's Republic of China.
The Review of Scientific Instruments
|April 3, 2014
Summary
A novel charge neutralization method accurately measures insulator secondary electron yield. By negatively biasing the collector, positive charge buildup is prevented, enabling reliable electron yield measurements.
Area of Science:
- Materials Science
- Surface Science
- Physics
Background:
- Accurate measurement of electron-induced secondary electron yield is crucial for understanding material properties.
- Insulators pose challenges due to charge accumulation during electron beam irradiation.
- Existing methods often require complex setups or are not suitable for single pulsed electron guns.
Purpose of the Study:
- To develop a simple and effective charge neutralization method for measuring insulator secondary electron yield.
- To enable accurate measurements using a single pulsed electron gun system.
- To validate the method's efficacy through experimental data.
Main Methods:
- A negative bias is applied to the secondary electron collector relative to the sample.
- This bias forces emitted secondary electrons back to the sample, neutralizing accumulated positive charge.
- The optimal bias voltage and equilibrium charging state are determined.
Main Results:
- The charge neutralization method significantly improves the accuracy of secondary electron yield measurements for insulators.
- Demonstrated efficacy by comparing measurements with and without neutralization.
- Results for polyimide align with existing literature data, validating the technique.
Conclusions:
- The developed charge neutralization technique is simple, effective, and suitable for single pulsed electron gun systems.
- It overcomes the challenge of charge accumulation in insulators, enabling reliable secondary electron yield determination.
- This method provides a valuable tool for surface analysis and material characterization.
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