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Updated: May 1, 2026

Atom Probe Tomography Studies on the CuIn,GaSe2 Grain Boundaries
Published on: April 22, 2013
Atom probe tomography of lithium-doped network glasses
Gerd-Hendrik Greiwe1, Zoltan Balogh2, Guido Schmitz2
1Institute of Materials Physics, University of Münster, Wilhelm-Klemm-Str. 10, D-48149 Münster, Germany.
Abstract:
Li-doped silicate and borate glasses are electronically insulating, but provide considerable ionic conductivity. Under measurement conditions of laser-assisted atom probe tomography, mobile Li ions are redistributed in response to high electric fields. In consequence, the direct interpretation of measured composition profiles is prevented. It is demonstrated that composition profiles are nevertheless well understood by a complex model taking into account the electronic structure of dielectric materials, ionic mobility and field screening. Quantitative data on band bending and field penetration during measurement are derived which are important in understanding laser-assisted atom probe tomography of dielectric materials.
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