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Updated: May 1, 2026

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
Published on: January 26, 2016
Direct dynamical evidence for the spin glass lower critical dimension 2<d(ℓ)<3
Samaresh Guchhait1, Raymond Orbach2
1Microelectronics Research Center, The University of Texas at Austin, Austin, Texas 78758, USA.
Abstract:
A dynamical method is introduced to study the effect of dimensionality on phase transitions. Direct experimental measurements for the lower critical dimension for spin glasses is provided as an example. The method makes use of the spin glass correlation length ξ(t,T). Once nucleated, it can become comparable to sample dimensions in convenient time and temperature ranges. Thin films of amorphous Ge:Mn alloys were prepared with thickness L≈15.5 nm. Conventional behavior is observed as long as ξ(t,T)
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