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Updated: Apr 30, 2026
Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
Published on: December 20, 2016
Frequency, amplitude, and phase measurements in contact resonance atomic force microscopies
Gheorghe Stan1, Santiago D Solares2
1Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20878, USA ; Department of Mechanical Engineering, University of Maryland, College Park, MD 20742, USA.
Abstract:
The resonance frequency, amplitude, and phase response of the first two eigenmodes of two contact-resonance atomic force microscopy (CR-AFM) configurations, which differ in the method used to excite the system (cantilever base vs sample excitation), are analyzed in this work. Similarities and differences in the observables of the cantilever dynamics, as well as the different effect of the tip-sample contact properties on those observables in each configuration are discussed. Finally, the expected accuracy of CR-AFM using phase-locked loop detection is investigated and quantification of the typical errors incurred during measurements is provided.
