Frequency-dependent nanomechanical profiling for medical diagnosis

Santiago D Solares1, Alexander X Cartagena-Rivera2

  • 1Department of Mechanical and Aerospace Engineering, The George Washington University, School of Engineering and Applied Science, Washington, District of Columbia, USA.

Summary

Atomic force microscopy (AFM) offers powerful nanomechanical insights but is underused in healthcare. Integrating AFM with data analysis and communication can improve disease diagnosis and management.