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Patch Clamp

Patch Clamp

Many fundamental cell functions such as muscle contraction and nerve transmission rely on the electrical signals produced by the movement of positively and negatively charged ions across the cell membrane. One competent method to record current flowing across the whole cell or single ion channel is the patch-clamp technique.
In this method, a glass micropipette containing electrolyte solution is tightly sealed against a small portion of the cell membrane. As a result, a patch of the cell...

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Related Experiment Video

Updated: Apr 30, 2026

Culturing and Electrophysiology of Cells on NRCC Patch-clamp Chips

Culturing and Electrophysiology of Cells on NRCC Patch-clamp Chips

Published on: February 7, 2012

Priming and testing silicon patch-clamp neurochips.

Christophe Py¹, Michael W Denhoff¹, Nicaulas Sabourin¹

¹National Research Council of Canada, 1200 Montreal Road, Ottawa, Ontario K1A 0R6, Canada.

New Biotechnology

|May 1, 2014

Summary

This summary is machine-generated.

Automated priming and testing of silicon patch-clamp chips achieves nearly 90% success. This rapid, automated process is suitable for large-scale electrophysiology experiments.

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Last Updated: Apr 30, 2026

Culturing and Electrophysiology of Cells on NRCC Patch-clamp Chips

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Published on: February 7, 2012

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Area of Science:

Biophysics
Materials Science
Electrical Engineering

Background:

Silicon planar patch-clamp chips are crucial for electrophysiology.
Manual assembly and testing present challenges for large-scale production.

Purpose of the Study:

To develop and evaluate a systematic, automated method for priming and testing silicon planar patch-clamp chips.
To assess the efficiency and reliability of the automated setup for high-throughput applications.

Main Methods:

Assembly of silicon chips in Plexiglas packages.
Sterilization using an air plasma reactor.
Automated priming and electrical testing of the chips.

Main Results:

Nearly 90% of chips were successfully primed with the automated setup.
Shunt capacitance values ranged from 10 pF to 30 pF.
Chip failures were primarily attributed to glue invasion, with assembly variability impacting capacitance.

Conclusions:

The automated priming and testing system is highly efficient, with a success rate approaching 90%.
The process takes less than 5 minutes per chip, making it compatible with mass production for electrophysiology.
Addressing glue invasion and assembly variability is key to further optimizing chip performance.