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Detection of Rare Genomic Variants from Pooled Sequencing Using SPLINTER
Published on: June 23, 2012
Nor Muzlifah Mahyuddin1, Gordon Russell2
1School of Electrical and Electronic Engineering, Universiti Sains Malaysia, Engineering Campus, 14300 Nibong Tebal, Penang, Malaysia.
High bias currents improve single event upset (SEU) tolerance in advanced semiconductor technologies, despite increased power consumption. Temperature and transistor size have minimal direct impact on SEU tolerance.
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