Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation
Inductively Coupled Plasma Atomic Emission Spectroscopy: Principle
Atomic Absorption Spectroscopy: Interference
Atomic Emission Spectroscopy: Interference
Atomic Emission Spectroscopy: Lab
Inductively Coupled Plasma-Mass Spectrometry (ICP-MS): Interferences
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Updated: Apr 30, 2026

Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
Hiroyuki Arakawa1, Hiroshi Tojo1, Hajime Sasao1
1Japan Atomic Energy Agency, 801-1 Mukoyama, Naka-shi, Ibaraki 311-0193, Japan.
A novel plasma electron density measurement technique utilizes optical frequency comb interferometry to achieve high-density measurements accurately. This method overcomes traditional fringe counting errors for precise plasma diagnostics.
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