X-ray Crystallography
Determination of Crystal Structures
X-ray Diffraction of Biological Samples
Crystallographic Point Groups
Imperfections in Crystal Structure: Stoichiometric Point Defects
Imperfections in Crystal Structure: Point, Line and Plane Defects
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Updated: Apr 30, 2026

On-Chip Crystallization and Large-Scale Serial Diffraction at Room Temperature
Published on: March 11, 2022
1ETH Zürich, Laboratorium für Kristallographie, Vladimir-Prelog-Weg 5, CH-8093 Zürich, Switzerland. thomas.weber@mat.ethz.ch.
Diffuse scattering analysis, using advanced X-ray tools and modeling, now quantitatively reveals real crystal structures beyond traditional methods. This technique offers deeper insights into disordered materials, advancing materials science research.
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