Filtering chromatic aberration for wide acceptance angle electrostatic lenses
Related Experiment Video
Updated: Apr 30, 2026

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope
Published on: September 14, 2018
Abstract:
Chromatic aberration is a major issue for imaging mainly with large acceptance angle electrostatic lenses. Its correction is necessary to take advantage of the outstanding spatial and angular resolution that these lenses provide. We propose a method to eliminate the effect of chromatic aberration on the measured images by determining the impact resulting from higher and lower kinetic energies. Based on a spectral image sequence and a matrix, which describes the transmission function of the lens, a system of linear equations is solved to approximate the 2D spectral intensity distribution of the sample surface. We present the description of our method and preliminary test results, which show significant contrast and image quality improvement. The presented algorithm can also be applied as a software-based energy analyzer.
More Related Videos
09:00Indoor Experimental Assessment of the Efficiency and Irradiance Spot of the Achromatic Doublet on Glass ADG Fresnel Lens for Concentrating Photovoltaics
Published on: October 27, 2017
08:18High-Accuracy Correction of 3D Chromatic Shifts in the Age of Super-Resolution Biological Imaging Using Chromagnon
Published on: June 16, 2020
Related Concept Videos
Focusing of Light in the Eye
Electrostatic Boundary Conditions in Dielectrics
Consider a case where both the mediums across a boundary are two different dielectric materials. Recall that the electric field and electric displacement are proportional and related through the material's permittivity....