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Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities
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Imaging atomic-level random walk of a point defect in graphene

Jani Kotakoski1, Clemens Mangler2, Jannik C Meyer2

  • 11] Faculty of Physics, University of Vienna, Boltzmanngasse 5, A-1090 Vienna, Austria [2] Department of Physics, University of Helsinki, PO Box 43, FI-00014 Helsinki, Finland.

Nature Communications
|May 31, 2014
PubMed
Summary

Researchers directly observed point defect diffusion in graphene using a scanning transmission electron microscope. This breakthrough overcomes imaging challenges and allows direct tracking of defect migration in crystalline materials.

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