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Updated: Apr 28, 2026
In Situ Measurement of Vacuum Window Birefringence using 25Mg+ Fluorescence
Published on: June 13, 2020
Measurement of modal birefringence in optical waveguides based on the Mach-Zehnder interferometer
Ze Bing Zhong1, Zhi Cheng Fu2, Jian Dong Shi2
1Laboratory of Nanophotonic Functional Materials and Devices, School for Information and Optoelectronic Science and Engineering, South China Normal University, Guangzhou 510006, China.
Abstract:
A method for measuring the birefringence in planar waveguide circuits is theoretically proposed and validated. The method is based on the Mach-Zehnder interference and by measuring the spectral shift due to orthogonal polarization states. The birefringence of a silica waveguide is measured to be 2.33 × 10(-4) at nearby 1550 nm. In addition, the birefringence variations with the wavelength and its dependence on the external stress are investigated with the proposed method experimentally. The results in measuring birefringence demonstrate a high accuracy with the order of 10(-5), a wide dynamic range from 10(-5) to 10(-3), and a characteristic of multi-wavelength evaluation.
