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Related Concept Videos

UV–Vis Spectrometers01:14

UV–Vis Spectrometers

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The absorbance of UV and visible (UV–visible) radiations is measured using a UV–visible spectrophotometer. Deuterium lamps, which emit UV radiation, and tungsten lamps, which produce radiation in the visible region, are used as light sources in UV–visible spectrophotometers. A monochromator or prism is used for diffraction grating, i.e., to split the incoming radiation into different wavelengths. A system of slits is used to focus the desired wavelength on the sample cell.
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Ultraviolet and Visible (UV–Vis) Spectroscopy: Overview01:02

Ultraviolet and Visible (UV–Vis) Spectroscopy: Overview

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Ultraviolet–visible (UV–visible or UV–Vis) spectroscopy is an analytical technique that investigates the interaction between matter and UV–Vis light within the electromagnetic spectrum. This method is widely used for its versatility, simplicity, and relatively quick data acquisition, making it valuable for both qualitative and quantitative analysis. When UV–Vis radiation passes through a material,  molecules absorb light depending on the energy required for...
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Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

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Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
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Atomic Emission Spectroscopy: Instrumentation01:22

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The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
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UV–Vis Spectroscopy: Molecular Electronic Transitions01:16

UV–Vis Spectroscopy: Molecular Electronic Transitions

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In Ultraviolet–Visible (UV–Vis) spectroscopy, the absorption of electromagnetic radiation is used to probe the electronic structure of molecules. This technique provides insights into molecular electronic transitions, particularly the movement of electrons between different molecular orbitals. Radiation is absorbed if the energy of the electromagnetic radiation passing through the molecule is precisely equal to the energy difference between the excited and ground states. During this...
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Atomic Absorption Spectroscopy: Radiation and Light Sources01:13

Atomic Absorption Spectroscopy: Radiation and Light Sources

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Atomic absorption spectroscopy (AAS) relies on the Beer-Lambert law, which requires that the radiation source emits a narrow range of wavelengths to match the absorption characteristics of the analyte atom. The primary criteria for choosing an appropriate radiation source in AAS is to provide a precise and intense emission at specific wavelengths that will allow accurate detection of the analyte.
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Related Experiment Video

Updated: Apr 28, 2026

Molecular Beam Mass Spectrometry With Tunable Vacuum Ultraviolet VUV Synchrotron Radiation
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A synchrotron-radiation-based variable angle ellipsometer for the visible to vacuum ultraviolet spectral range.

M D Neumann1, C Cobet1, H Kaser2

  • 1Leibniz-Institut für Analytische Wissenschaften - ISAS - e.V., 12489 Berlin, Germany.

The Review of Scientific Instruments
|June 2, 2014
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Summary

A new spectroscopic ellipsometer measures polarization from 2 eV to 40 eV, enabling advanced material characterization. It features a novel compensator for vacuum ultraviolet measurements, enhancing analysis of depolarizing samples.

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Area of Science:

  • Optics and Photonics
  • Materials Science
  • Metrology

Background:

  • Ellipsometry is a powerful technique for characterizing optical properties of materials.
  • Broad energy range spectroscopic ellipsometry is crucial for advanced material analysis.
  • Vacuum ultraviolet (VUV) spectral range presents challenges for polarization control.

Purpose of the Study:

  • To present a novel rotating analyzer spectroscopic polarimeter and ellipsometer (RASPE) with a wide energy range.
  • To introduce a new compensator design for VUV ellipsometry.
  • To demonstrate the instrument's capability in characterizing materials and beamline polarization.

Main Methods:

  • Installation of a RASPE with a wide-range θ-2θ goniometer at the Metrology Light Source.
  • Utilizing transmission- and reflection-based polarizing elements and undulator radiation.
  • Development and implementation of a CaF2 Fresnel rhomb compensator for VUV measurements.

Main Results:

  • The ellipsometer covers photon energies from 2 eV to 40 eV.
  • The CaF2 Fresnel rhomb compensator enables circular polarization measurements in the VUV range.
  • Initial characterization of beamline polarization and dielectric function of ZnO were successfully performed.

Conclusions:

  • The developed RASPE is a versatile instrument for broad energy range spectroscopic ellipsometry.
  • The new VUV compensator expands the capabilities for analyzing depolarizing samples.
  • The instrument is suitable for precise metrology and material characterization, as demonstrated by ZnO analysis.