Related Experiment Video
Updated: Apr 28, 2026

14:31
Bioelectric Analyses of an Osseointegrated Intelligent Implant Design System for Amputees
Published on: July 15, 2009
15.7K
Intraosseous access in the military operational setting
Summary
Intraosseous (IO) devices like EZ-IO and FAST1 show an 84.7% success rate for emergency circulatory access in military settings. Device failure was more common in the humerus, with flushing issues being the primary cause.
Area of Science:
- Emergency Medicine
- Trauma Surgery
- Military Medicine
Background:
- Circulatory access is challenging in military settings due to hypovolemia and limited responder experience.
- Rapid access is critical for injuries causing catastrophic hemorrhage, like traumatic amputations.
- The EZ-IO and FAST1 intraosseous devices have been used by Defence Medical Services since 2006.
Purpose of the Study:
- To evaluate the functionality and complication rates of EZ-IO and FAST1 intraosseous devices in an operational military environment.
- To assess the real-world performance of these devices in emergency trauma care.
Main Methods:
- A prospective observational study was conducted from March to July 2011 at Camp Bastion, Afghanistan.
- Data on 195 intraosseous devices (149 EZ-IO, 46 FAST1) in 117 patients were recorded.
- Device functionality (successful flush) and any encountered problems were documented.
Main Results:
- An overall success rate of 84.7% was achieved, with 111 out of 117 devices functioning.
- Device failure occurred in 17 instances, with the humerus being a more prevalent site for failure.
- Inability to flush the device was the leading cause of failure, followed by mechanical issues. Two complications involved device breakage upon removal.
Conclusions:
- Intraosseous devices demonstrated success rates comparable to existing literature, even after a median insertion time of 32 minutes.
- No significant differences in device performance were observed between different insertion sites.
- Further research is recommended to investigate the long-term complications associated with intraosseous device use.

