Connecting heterogeneous single slip to diffraction peak evolution in high-energy monochromatic X-ray experiments

Area of Science:

• Materials Science
• Crystallography
• Computational Modeling

Background:

• Understanding plastic deformation mechanisms is crucial for materials engineering.
• High-energy diffraction microscopy (HEDM) offers insights into material microstructure.
• Accurate identification of slip systems is key to predicting material response.

Purpose of the Study:

• To introduce a novel forward modeling diffraction framework.
• To enable the identification of slip system activity in HEDM experiments.
• To validate the framework using simulated and experimental data.

Main Methods:

• Developed a forward modeling diffraction framework.
• Performed diffraction simulations on virtual mosaic crystals using Nye's heterogeneous single slip model.
• Compared simulated diffraction peaks with experimental HEDM measurements.
• Utilized in situ HEDM data from plastically deformed silicon single crystals.

Main Results:

• The framework successfully identified slip system activity.
• Simulations accurately reproduced diffraction patterns consistent with experimental data.
• The method proved effective under single-slip conditions in silicon.

Conclusions:

• The introduced framework is effective for identifying slip system activity in HEDM.
• This approach enhances the analysis of plastic deformation in crystalline materials.
• The findings contribute to a more precise understanding of material behavior under stress.