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Hybrid MOS-PN photodiode with positive feedback for pulse-modulation imaging
Optics Express
|July 1, 2014
Summary
A novel CMOS-compatible photodetector directly converts light to time, simplifying time-to-digital conversion by eliminating analog processing. This innovation offers promising linearity, gain, and noise performance for advanced optical sensing applications.
Area of Science:
- Photonics and Semiconductor Devices
- Integrated Circuit Design
- Optoelectronics
Background:
- Traditional photodetectors often require complex analog processing for time-based measurements.
- Existing solutions can be bulky and power-intensive, limiting integration possibilities.
Purpose of the Study:
- To propose and characterize a new CMOS-compatible photodetector with intrinsic light-to-time conversion.
- To enable direct time-to-digital conversion at the photodetector output, bypassing analog stages.
- To demonstrate a device suitable for miniaturized and efficient optical sensing systems.
Main Methods:
- Device fabrication using a standard 0.18µm CMOS process.
- Utilizing a deeply depleted MOS structure controlling a forward-biased PN diode.
- Employing Technology Computer-Aided Design (TCAD) simulations for parameter analysis.
- Experimental characterization under varying bias and illumination conditions.
Main Results:
- Demonstrated intrinsic light-to-time conversion capability.
- Achieved direct start of time-to-digital conversion, eliminating analog front-end.
- TCAD simulations validated the impact of semiconductor parameters and bias.
- Experimental measurements confirmed excellent linearity, internal gain, and noise performance.
Conclusions:
- The proposed photodetector offers a simplified and efficient approach to optical time measurements.
- Its CMOS compatibility and promising performance metrics pave the way for integrated optoelectronic systems.
- This device represents a significant advancement in photodetector technology for digital signal processing.
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