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Updated: Apr 27, 2026

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
Published on: April 18, 2019
Approaching the limits of carrier-envelope phase stability in a millijoule-class amplifier
Abstract:
The demand for ever shorter light pulses presents a challenge to the detection and stabilization of the carrier-envelope phase (CEP) in amplifier systems. Here we present a combination of single-shot detection and a fast actuator that is capable of measuring and correcting the CEP in every single shot emitted by a millijoule-scale, multi-kHz femtosecond laser amplifier. The residual CEP noise within 50 s amounts to 98 mrad rms in-loop (fast detection, 5·10⁵ shots) and 140 mrad out-of-loop (slow detection, 6250 shots), approaching the noise floor of the f-to-2f measurement. Both values represent a twofold improvement of the CEP stability over previously published results in comparable systems.
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