Thickness-dependent attraction or repulsion between defects on a thin elastic film

L H He1

  • 1CAS Key Laboratory of Mechanical Behavior and Design of Materials & Institute of Solid State Physics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China.

Summary

This study reveals that the elastic interaction between defects in thin films depends on film thickness. Attraction or repulsion between twofold symmetric defects is influenced by coupled tangential and normal forces, crucial for understanding cell interactions.

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