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Electrical transport properties of single-layer WS2
Dmitry Ovchinnikov1, Adrien Allain, Ying-Sheng Huang
1Electrical Engineering Institute, Ecole Polytechnique Federale de Lausanne (EPFL) , CH-1015 Lausanne, Switzerland.
ACS Nano
|July 29, 2014
Summary
We fabricated field-effect transistors using tungsten disulfide (WS2) layers, revealing its excellent electronic properties. Optimized devices show high on/off ratios and mobilities, suitable for advanced electronics.
Area of Science:
- Materials Science
- Condensed Matter Physics
- Nanotechnology
Background:
- Transition Metal Dichalcogenides (TMDs) like WS2 are promising 2D semiconductors.
- Understanding their electronic transport properties is crucial for device applications.
Purpose of the Study:
- Fabricate and characterize field-effect transistors (FETs) using single-layer and bilayer WS2.
- Investigate the electronic transport properties of WS2 FETs.
- Explore the influence of device environment and annealing on WS2 properties.
Main Methods:
- Fabrication of WS2-based field-effect transistors (FETs).
- In situ annealing for improved contact transparency.
- Four-terminal and two-terminal electrical transport measurements.
- Analysis of device behavior across different charge carrier densities and temperatures.
Main Results:
- WS2 FETs exhibit n-type behavior with high room-temperature on/off current ratios (~10^6).
- High mobilities were observed (~140 cm^2/(V·s) for monolayers, >300 cm^2/(V·s) for bilayers at low temperatures).
- Metallic behavior at high carrier densities and variable-range hopping in the insulating regime were identified.
Conclusions:
- WS2 demonstrates excellent electronic properties comparable to MoS2 and WSe2.
- Strong spin-orbit coupling in WS2 enhances its potential for electronic, optical, and valleytronic devices.
- Optimized fabrication and annealing are key to realizing the intrinsic properties of WS2 for future applications.
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