Voltage-Thickness-Gray imaging physical model in X-ray energy auto-modulation

Ping Chen1, Yan Han2, Jinxiao Pan2

  • 1National Key Laboratory for Electronic Measurement Technology, North University of China, Taiyuan, Shanxi, China Key Laboratory of Instrumentation Science and Dynamic Measurement, North University of China, Taiyuan, Shanxi, China State Key Laboratory of Management and Control for Complex Systems, Institute of Automation, Chinese Academy of Sciences, Beijing, China.