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Author Spotlight: A Machine-Vision Approach to Transmission Electron Microscopy Workflows, Results Analysis and Data Management
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Magnified pseudo-elemental map of atomic column obtained by Moiré method in scanning transmission electron microscopy

Yukihito Kondo1, Eiji Okunishi2

  • 1EM Business Unit, JEOL Ltd, 3-1-2 Musashino, Akishima, Tokyo 19-8558, Japan kondo@jeol.co.jp.

Microscopy (Oxford, England)
|August 1, 2014
PubMed

Keywords:
Moiréatomic column elemental mapenergy dispersive X-ray spectroscopyscanning transmission electron microscopyspecimen damage by electron beam irradiationspherical aberration corrector

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