Adding diffuse reflectance infrared Fourier transform spectroscopy capability to extended x-ray-absorption fine

Gian Luca Chiarello1, Maarten Nachtegaal2, Valentina Marchionni2

  • 1Dipartimento di Chimica, Università degli Studi di Milano, Via C. Golgi 19, I-20133 Milano, Italy and Empa, Swiss Federal Laboratories for Materials Science and Technology, Lab. for Solid State Chemistry and Catalysis, Ueberlandstrasse 129, CH-8600 Dübendorf, Switzerland.

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