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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
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The secondary X-ray fluorescence and absorption near the interface of multi-material: case of EDS microanalysis

A Zoukel1, L Khouchaf1

  • 1Univ-Lille Nord de France, Ecole des Mines de Douai, 941, rue Charles Bourseul BP 10838, 59500 Douai, France.

Micron (Oxford, England : 1993)
|August 3, 2014
PubMed

Keywords:
EDS microanalysisEDS profileInterfaceLateral resolutionSecondary X-ray fluorescenceX-ray absorption

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