Sparse-view computed laminography with a spherical sinusoidal scan for nondestructive testing.

Area of Science:

• Materials Science
• Imaging Technology
• Nondestructive Testing

Background:

• X-ray computed laminography is a key nondestructive testing (NDT) method for flat objects.
• Current oblique scanning configurations require significant radiation dose and scanning time.
• There is a need for faster, lower-dose imaging techniques for sensitive devices.

Purpose of the Study:

• To propose and evaluate a novel scanning scheme for X-ray computed laminography.
• To reduce radiation dose and scanning time in NDT applications.
• To improve image quality in terms of contrast and spatial resolution.

Main Methods:

• A new scanning scheme was developed and compared numerically with existing methods (single-arc, double-arc, oblique, spherical-sinusoidal).
• Compressive-sensing-based total-variation (TV) minimization was employed for image reconstruction.
• Image reconstruction was performed using only 40 projection views.

Main Results:

• The proposed scanning scheme demonstrated superior image contrast and spatial resolution compared to other tested configurations.
• Oblique scanning showed comparable spatial resolution but was outperformed in contrast.
• The method successfully reconstructed images with reduced data acquisition parameters.

Conclusions:

• The novel scanning scheme offers a promising solution for fast, low-dose NDT.
• This technique is particularly beneficial for radiation-sensitive and highly integrated devices, such as multilayer microelectronic circuit boards.
• The findings pave the way for more efficient and safer industrial inspection processes.