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Published on: January 28, 2019
Wavefront reconstruction in phase-shifting interferometry via sparse coding of amplitude and absolute phase
This study introduces a new algorithm, sparse phase and amplitude reconstruction (SPAR), for wavefront reconstruction in phase-shifting interferometry. SPAR improves accuracy and speed by using sparse modeling to address noise and phase ambiguity in optical measurements.
Area of Science:
- Coherent optical metrology
- Computational imaging
- Signal processing
Background:
- Phase-shifting interferometry offers high accuracy and speed for applications like industrial quality inspection.
- Wavefront reconstruction is challenging due to Poissonian noise and 2π phase ambiguity.
- Conventional methods struggle with absolute phase reconstruction and simultaneous phase unwrapping.
Purpose of the Study:
- To develop a novel algorithm for accurate wavefront reconstruction in phase-shifting interferometry.
- To address limitations of conventional techniques in handling noise and phase periodicity.
- To enable simultaneous reconstruction of object amplitude and absolute phase.
Main Methods:
- Formulating wavefront reconstruction as a sparse inverse problem.
- Utilizing sparse linear representations for amplitude and absolute phase.
- Introducing the sparse phase and amplitude reconstruction (SPAR) algorithm.
- Employing data-adaptive block-matching 3D (BM3D) frames for sparse representation.
- Accounting for Poissonian (photon counting) measurements.
Main Results:
- The SPAR algorithm effectively reconstructs both amplitude and absolute phase.
- SPAR demonstrates improved accuracy in interferometric phase reconstruction.
- Simultaneous phase unwrapping is achieved by SPAR.
- Experimental comparisons validate SPAR's effectiveness against competing methods.
Conclusions:
- Sparse modeling provides a robust framework for wavefront reconstruction in phase-shifting interferometry.
- The SPAR algorithm offers a significant advancement in overcoming noise and phase ambiguity.
- SPAR enhances the reliability and applicability of interferometric techniques for quality inspection and other fields.
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