Opto-mechanical probe for combining atomic force microscopy and optical near-field surface analysis

Area of Science:

• Surface science
• Microscopy techniques
• Nanotechnology

Background:

• Atomic Force Microscopy (AFM) and Scanning Near-field Optical Microscopy (SNOM) are powerful surface analysis tools.
• Combining AFM and SNOM offers enhanced capabilities for surface characterization.
• Existing probes for combined AFM-SNOM often have limitations.

Purpose of the Study:

• To develop a novel, user-friendly probe for integrated AFM and SNOM.
• To demonstrate the probe's ability to visualize evanescent fields under total internal reflection.
• To achieve simultaneous AFM and SNOM imaging with high resolution.

Main Methods:

• Development of a new probe designed for dual AFM and SNOM operation.
• Utilizing total internal reflection to generate evanescent fields.
• Approaching the sample surface with the scanning tip to detect optical signals.
• Acquiring simultaneous AFM and SNOM images of a test grating in air and liquid.

Main Results:

• The new probe successfully visualizes evanescent fields near the surface.
• Simultaneous AFM and SNOM imaging was achieved for a standard test grating.
• Lateral resolution was determined to be 45 nm for AFM and 160 nm for SNOM.
• The developed probe overcomes limitations of commercial alternatives while maintaining resolution.

Conclusions:

• The new probe provides an effective and easy-to-use solution for combined AFM-SNOM.
• This technology enhances the ability to study surface properties at the nanoscale.
• The probe's performance in both air and liquid environments demonstrates its versatility.