MOS Capacitor
Biasing of Metal-Semiconductor Junctions
Ohm's Law
Non-ohmic Devices
Metal-Semiconductor Junctions
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In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
Published on: May 13, 2020
Ming Wang1, Chong Bi1, Ling Li2
11] Lab of Nanofabrication and Novel Device Integration, Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China [2].
Understanding electron transport in resistive switching memory is key. This study reveals small-polaron hopping governs conductive filaments, with a semiconductor-metal transition observed in low resistance states.
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