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Updated: Apr 25, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
Atomic force microscope-assisted scanning tunneling spectroscopy under ambient conditions
Amin Vakhshouri1, Katsushi Hashimoto2, Yoshiro Hirayama3
1Department of Physics, Graduate School of Science, Tohoku University, Sendai, Miyagi 980-8578, Japan amin-v@s.tohoku.ac.jp.
Abstract:
We have developed a method of atomic force microscopy (AFM)-assisted scanning tunneling spectroscopy (STS) under ambient conditions. An AFM function is used for rapid access to a selected position prior to performing STS. The AFM feedback is further used to suppress vertical thermal drift of the tip-sample distance during spectroscopy, enabling flexible and stable spectroscopy measurements at room temperature.
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