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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

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Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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Atomic fluorescence spectroscopy (AFS) is an analytical technique that involves the electronic transitions of atoms in a flame, furnace, or plasma being excited by electromagnetic (EM) radiation. When these atoms absorb energy, they become excited and subsequently release energy as they return to their original state. This emitted light, or "fluorescence," is observed at a right angle to the incident beam. Both absorption and emission processes transpire at distinct wavelengths, which...
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The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
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Atomic spectroscopy is a vital tool in elemental analysis, both qualitatively and quantitatively. It can be broadly divided into optical spectroscopy, mass spectroscopy, and X-ray spectroscopy methods. The optical spectroscopic methods are atomic absorption spectroscopy (AAS), atomic emission spectroscopy (AES), and atomic fluorescence spectroscopy (AFS). The first step in all three methods is atomization, where the solid, liquid, or solution-phase samples are converted into gas-phase atoms and...
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Related Experiment Video

Updated: Apr 25, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
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Atomic force microscope-assisted scanning tunneling spectroscopy under ambient conditions.

Amin Vakhshouri1, Katsushi Hashimoto2, Yoshiro Hirayama3

  • 1Department of Physics, Graduate School of Science, Tohoku University, Sendai, Miyagi 980-8578, Japan amin-v@s.tohoku.ac.jp.

Microscopy (Oxford, England)
|August 23, 2014
PubMed
Summary

We developed atomic force microscopy-assisted scanning tunneling spectroscopy for stable room temperature measurements. This method uses AFM to precisely position the tip and minimize drift during spectroscopy.

Keywords:
combined atomic force/tunneling microscopyroom temperature tunneling spectroscopythermal drift suppression

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Area of Science:

  • Surface science
  • Nanotechnology
  • Materials characterization

Background:

  • Scanning tunneling spectroscopy (STS) is a powerful technique for probing local electronic properties.
  • Traditional STS often requires ultra-high vacuum (UHV) or cryogenic conditions for stability.
  • Ambient condition measurements are desirable for broader applicability and reduced experimental complexity.

Purpose of the Study:

  • To develop a novel method combining Atomic Force Microscopy (AFM) and Scanning Tunneling Spectroscopy (STS).
  • To enable stable and flexible STS measurements under ambient conditions at room temperature.
  • To leverage AFM's capabilities for improved positioning and drift suppression during STS.

Main Methods:

  • Integration of AFM for rapid positional targeting of the sample surface.
  • Utilizing AFM's feedback loop to actively suppress vertical thermal drift during STS acquisition.
  • Performing STS measurements under ambient laboratory conditions.

Main Results:

  • Successful development of an AFM-assisted STS technique.
  • Demonstrated ability to perform stable spectroscopy measurements at room temperature.
  • Achieved precise tip positioning and effective suppression of vertical thermal drift.

Conclusions:

  • AFM-assisted STS provides a viable pathway for ambient, room-temperature electronic property measurements.
  • The method enhances the stability and flexibility of STS, broadening its potential applications.
  • This technique facilitates more accessible nanoscale electronic characterization.