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Updated: Apr 25, 2026

High Pressure Single Crystal Diffraction at PX^2
Published on: January 16, 2017
Strength of shock-loaded single-crystal tantalum [100] determined using in situ broadband x-ray Laue diffraction
A J Comley1, B R Maddox2, R E Rudd2
1Lawrence Livermore National Laboratory, Livermore, California 94550, USA and Atomic Weapons Establishment, Aldermaston, Reading RG7 4PR, United Kingdom.
Abstract:
The strength of shock-loaded single crystal tantalum [100] has been experimentally determined using in situ broadband x-ray Laue diffraction to measure the strain state of the compressed crystal, and elastic constants calculated from first principles. The inferred strength reaches 35 GPa at a shock pressure of 181 GPa and is in excellent agreement with a multiscale strength model [N. R. Barton et al., J. Appl. Phys. 109, 073501 (2011)], which employs a hierarchy of simulation methods over a range of length scales to calculate strength from first principles.
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