Modeling nanoscale inhomogeneities for quantitative HAADF STEM imaging.

Richard Aveyard1, Riccardo Ferrando2, Roy L Johnston3

  • 1Department of Physics, University of York, Heslington, York YO10 5DD, United Kingdom.

Physical Review Letters
|August 30, 2014
PubMed
Summary

High-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) combined with simulations reveals crucial structural details of nanomaterials. Surface effects significantly impact image intensities, essential for accurate 3D structural characterization.

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