X-ray Crystallography
Determination of Crystal Structures
Total Internal Reflection Fluorescence Microscopy
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Updated: Apr 24, 2026

An All-in-one Sample Holder for Macromolecular X-ray Crystallography with Minimal Background Scattering
Published on: July 6, 2019
1Forschungszentrum Jülich GmbH, Jülich Centre for Neutron Science at MLZ, Lichtenbergstrasse 1, D-85747 Garching, Germany.
This study analyzes Bragg reflections in imperfect crystals, finding multiple reflections slightly alter intensity but significantly change angular distributions and rocking curves.
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