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Related Experiment Video

Updated: Apr 24, 2026

$Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples$

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

Linear fitting of multi-threshold counting data with a pixel-array detector for spectral X-ray imaging.

Ryan D Muir¹, Nicholas R Pogranichney¹, J Lewis Muir²

¹Department of Chemistry, Purdue University, 560 Oval Drive, West Lafayette, IN 47907, USA.

Journal of Synchrotron Radiation

|September 2, 2014

Summary

This summary is machine-generated.

This study introduces a new spectral fitting model for X-ray photon-counting arrays. The model accurately calibrates pixel responses and recovers X-ray intensity images across different energies.

Keywords:

energy dispersive fractional counting multi-wavelength spectroscopic imaging

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Area of Science:

Medical Physics
Detector Physics

Background:

X-ray photon-counting detectors are crucial for medical imaging and materials science.
Accurate spectral information is vital for quantitative analysis.
Existing methods face challenges with pixel edge effects and energy calibration.

Purpose of the Study:

To develop an analytical model for spectral fitting of multi-threshold counting measurements on pixel-array detectors.
To account for edge/corner effects in X-ray photon detection using fractional photon counting.
To enable accurate recovery of X-ray intensity as a function of energy.

Main Methods:

Developed an analytical model for the probability density function of detected voltage in X-ray photon-counting arrays.
Utilized fractional photon counting to address voltage plume spread across pixels.
Mathematically calibrated each pixel by fitting detected voltage distributions to the model at specific X-ray energies (13.5 keV and 15.0 keV).

Main Results:

Successfully calibrated pixel responses using the developed analytical model.
Demonstrated the model's ability to account for edge/corner effects.
Statistically recovered X-ray intensity images as a function of X-ray energy in a simulated experiment.

Conclusions:

The developed spectral fitting model provides accurate pixel calibration for X-ray photon-counting arrays.
Fractional photon counting effectively mitigates edge/corner effects, improving data fidelity.
The methodology enables robust recovery of multi-energy X-ray intensity images, advancing quantitative spectral imaging.