Metal-Semiconductor Junctions
Biasing of Metal-Semiconductor Junctions
Formation of Complex Ions
Bonding in Metals
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Updated: Apr 24, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Dong-Youn Shin1, Jun-Young Seo, Min Gu Kang
1Department of Graphic Arts Information Engineering, Pukyong National University , 365, Sinseon-ro, Nam-gu, Busan, 608-739, Republic of Korea.
This study introduces silver neodecanoate to significantly lower silver paste contact resistivity at metal/semiconductor interfaces. This innovation ensures stable performance across a wide range of firing temperatures, crucial for silicon solar cells.
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