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$Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples$

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

An X-ray diffractometer using mirage diffraction.

Tomoe Fukamachi¹, Sukswat Jongsukswat¹, Dongying Ju¹

¹Saitama Institute of Technology, Fukaya, Saitama 369-0293, Japan.

Journal of Applied Crystallography

|September 23, 2014

Summary

This study presents a novel triple-crystal diffractometer using mirage diffraction. The instrument offers a simple setup and achieves high energy resolution for advanced materials analysis.

Keywords:

X-ray difractometers dynamical theory of X-ray diffraction interference fringes mirage diffraction mirage fringes monochromators

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Area of Science:

Materials Science
Crystallography
Diffraction Physics

Background:

Triple-crystal diffractometers are essential tools in materials science for high-resolution analysis.
Conventional setups can be complex and may have limitations in divergence and resolution.

Purpose of the Study:

To characterize a novel triple-crystal diffractometer setup.
To evaluate its performance in terms of simplicity, divergence, and energy resolution.

Main Methods:

Utilized a (+, -, +) silicon(220) crystal setting with mirage diffraction.
Employed a flat first crystal as a collimator.
Used bent second and third crystals as monochromator, sample, and analyzer.

Main Results:

Demonstrated an easy setup and simple structure for the diffractometer.
Achieved a small divergence angle from the second crystal.
Obtained high energy resolution of the order of sub-meV from the third crystal.

Conclusions:

The developed triple-crystal diffractometer offers significant advantages in ease of use and performance.
Its high energy resolution makes it suitable for advanced crystallographic studies.
The simple and effective design paves the way for more accessible high-resolution diffraction analysis.