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A Multimodal Wide-Field Fourier-Transform Raman Microscope
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High angular-resolution automated visible-wavelength scanning angle Raman microscopy.

Michael D Lesoine1, Jonathan M Bobbitt1, Shaobin Zhu1

  • 1U.S. Department of Energy, Ames Laboratory, Ames, IA 50011, United States; Department of Chemistry, Iowa State University, 1605 Gilman Hall, Ames, IA 50011, United States.

Analytica Chimica Acta
|September 30, 2014
PubMed
Summary
This summary is machine-generated.

This study introduces a scanning angle Raman microscope for detailed chemical analysis perpendicular to sample surfaces. The new instrument offers enhanced surface sensitivity and signal strength for efficient thin film analysis.

Keywords:
P3HT diblock copolymerRaman instrumentationRaman spectroscopyThin film measurementWaveguide

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Area of Science:

  • Spectroscopy
  • Chemical analysis
  • Materials science

Background:

  • Raman microscopy is a powerful tool for chemical identification.
  • Probing chemical composition perpendicular to interfaces requires specialized techniques.
  • Visible wavelength Raman offers potential advantages over near-infrared for surface analysis.

Purpose of the Study:

  • To develop and demonstrate a fully automated scanning angle (SA) Raman microscope.
  • To investigate the chemical content perpendicular to sample interfaces.
  • To highlight the benefits of visible wavelength SA Raman microscopy.

Main Methods:

  • Utilized a 532-nm excitation source for Raman spectroscopy.
  • Employed a fully automated rotational stage to vary incident angles (20.50-79.50°).
  • Integrated a prism-based sample interface on an inverted microscope stage.

Main Results:

  • Achieved precise angular control with an uncertainty of 0.09°.
  • Demonstrated enhanced surface sensitivity and signal strength compared to near-infrared wavelengths.
  • Successfully measured thin polymer films (polystyrene, diblock copolymer) with high signal-to-noise ratios (30) and short acquisition times (0.25 s).

Conclusions:

  • The developed SA Raman microscope effectively probes chemical content perpendicular to interfaces.
  • Visible wavelength excitation provides superior surface sensitivity and signal enhancement for thin film analysis.
  • The instrument's automation and efficiency enable rapid and detailed chemical characterization.