Imaging ultrafast carrier transport in nanoscale field-effect transistors

In the present study, we visualize ultrafast carrier dynamics in one-dimensional nanoscale devices, such as Si nanowire and carbon nanotube transistors using femtosecond photocurrent microscopy. We investigate transit times of ultrashort carriers that are generated near one metallic electrode and subsequently transported toward the opposite electrode based on drift and diffusion motions. Conversely, pure diffusion motion is observed when the pump pulse is located in the middle of the nanowires. Carrier dynamics have been addressed for various working conditions, in which we found that the carrier velocity and pulse width can be manipulated by the external electrodes. In particular, the carrier velocities extracted from transit times increase for a larger negative gate bias because of the increased field strength at the Schottky barrier.