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Related Experiment Video

Updated: Sep 9, 2025

Simulation, Fabrication and Characterization of THz Metamaterial Absorbers

Simulation, Fabrication and Characterization of THz Metamaterial Absorbers

Published on: December 27, 2012

Authentication of Counterfeit Electronics Using Rapid THz Time-of-Flight Imaging.

Hyeonseung Ryu¹, Byung Hee Son¹, Jihwan Kim¹

¹Department of Physics and Department of Energy Systems Research, Ajou University, Suwon 16499, Republic of Korea.

Sensors (Basel, Switzerland)

|August 28, 2025

Summary

This study introduces rapid terahertz time-of-flight (THz ToF) imaging to detect counterfeit electronics. The technique non-destructively reveals internal structures, effectively identifying fake devices and misused integrated circuit chips.

Keywords:

authentication nondestructive testing terahertz imaging time-of-flight

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Area of Science:

Applied Physics
Electrical Engineering
Materials Science

Background:

The proliferation of counterfeit electronics in the online market poses significant risks to consumers and industries.
Current authentication methods often struggle with non-destructive analysis of complex electronic devices.

Purpose of the Study:

To develop and demonstrate a rapid, non-destructive imaging technique for identifying counterfeit portable electronic devices.
To assess the capability of terahertz time-of-flight (THz ToF) imaging in detecting internal structural anomalies and misused components.

Main Methods:

Utilized rapid terahertz (THz) time-of-flight (ToF) imaging for reflection imaging of portable electronic devices.
Achieved a spatial resolution of 1 mm and a depth range exceeding 5 mm for non-destructive analysis.
Applied the technique to devices with plastic casings, including solid-state devices and earphones.

Main Results:

Successfully identified a counterfeit solid-state device by detecting significant differences in internal structure compared to authentic devices.
Demonstrated the ability to authenticate small portable devices with arbitrary shapes.
Highlighted the technique's effectiveness in detecting the inappropriate use of integrated circuit (IC) chips, such as controller chips in USB hubs.

Conclusions:

THz ToF imaging is a powerful, non-destructive tool for the rapid authentication of portable and wearable electronic devices.
The technique offers a versatile approach to combating counterfeit electronics and ensuring component integrity.
This method provides an effective solution for in-line product authentication and identifying the misuse of IC chips in various equipment.