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Simulation of a Scaled Assembly Process with Collaboration of a Robotic Arm and Monitoring through a Vision System for Quality Control
Published on: August 29, 2025
Correction: Amato et al. Detecting Important Features and Predicting Yield from Defects Detected by SEM in
Umberto Amato1, Anestis Antoniadis1, Italia De Feis2
1Istituto di Scienze Applicate e Sistemi Intelligenti, National Research Council of Italy, 80131 Napoli, Italy.
Sensors (Basel, Switzerland)
|August 27, 2026
Abstract:
In the published publication [...].

